Post-irradiated microstructural characterisation of cold-worked SS316L by X-ray diffraction technique

Mukherjee, P.Sarkar, A.Bhattacharya, M.Gayathri, N.Barat, P.2010-08-272010-08-272009http://hdl.handle.net/123456789/37933940 bytestext/htmlenPost-irradiated microstructural characterisationcold-worked SS316LX-ray diffraction techniqueWilliamson–Hall TechniqueLine Profile AnalysisPost-irradiated microstructural characterisation of cold-worked SS316L by X-ray diffraction techniqueArticle