Sahoo, N. K.Thakur, S.Senthilkumar, M.Tokas, R. B.Das, N. C.2019-04-012019-04-012004Vacuum, 2004. Vol. 77: pp. 87-96http://hdl.handle.net/123456789/180914420 bytestext/htmlenSelf-organizationMorphologyAtomic force microscopyOrdered grain structuresFast Fourier transformOptical thin filmGlancing incidence X-ray diffractionObservation and analysis of self-organized surface grain structures in silica films under nonepitaxial growth modeArticle