Surface characterization of magnesium fluoride thin films prepared by a fluorine trapping based non-reactive sputtering technique

De, R.Haque, S. M.Tripathi, S.Rao, K. D.Prathap, C.Sahoo, N. K.2018-04-192018-04-192016Vacuum, 2016. Vol. 134: pp. 110-119http://hdl.handle.net/123456789/160764656 bytestext/htmlenMgF2 thin filmsRF magnetron sputteringEllipsometryAtomic force microscopySurface correlation functionsRoughness evaluationSurface characterization of magnesium fluoride thin films prepared by a fluorine trapping based non-reactive sputtering techniqueArticle