Mali, S. S.Shinde, P. S.Betty, C. A.Bhosale, P. N.Oh, Y. W.Patil, P. S.2012-08-272012-08-272012Journal of Physics & Chemistry of Solids, 2012. Vol. 73 (6): pp. 735-740http://hdl.handle.net/123456789/65804125 bytestext/htmlenSemiconductingChemical synthesisX-ray diffractionElectrochemical propertiesSynthesis and characterization of Cu2ZnSnS4 thin films by SILAR methodArticle