Preparation and characterization of nanocrystalline tin oxide thin films deposited at room temperature

Deshpande, N. G.Vyas, J. C.Sharma, R.2010-04-162010-04-162008http://hdl.handle.net/123456789/22224152 bytestext/htmlenAtomic force microscopy (AFM)Tin oxideX-ray diffractionM-SILARNanostructuresPhotoluminescencePreparation and characterization of nanocrystalline tin oxide thin films deposited at room temperatureArticle