Rohatgi, R.Sathian, D.Jayalakshmi, V.Nair, S.Marathe, P. K.Chaurasiya, G.Kannan, S.2010-08-092010-08-092009http://hdl.handle.net/123456789/34414109 bytestext/htmlenCR-39SSNTDfast neutron monitoringchemical pre-etchingsensitivityReduction of background in CR-39 SSNTD using chemical pre-etching methodsArticle