Aswal, D. K.Joshi, N.Debnath, A. K.Muthe, K. P.Gupta, S. K.Yakhmi, J. V.2018-11-022018-11-022005Journal of Applied Physics, 2005. Vol. 98: Article no. 026103http://hdl.handle.net/123456789/172334172 bytestext/htmlenMorphology-dependent electric transporttextured ultrathin aluminum metal filmselectrical resistivitymolecular-beam epitaxyMorphology-dependent electric transport in textured ultrathin Al films grown on SiArticle