Verma, A.Wanderka, N.Singh, J. B.B. KumarBanhart, J.2014-01-232014-01-232013Ultramicroscopy, 2013. Vol. 132: pp. 227-232http://hdl.handle.net/123456789/84544042 bytestext/htmlen(3D-AP) Three-dimensional atom probe(SRO)Short-range orderStatistical analysisComposition fluctuationsTEM (transmission electron microscopy)Statistical analysis of composition fluctuations and short-range order in stoichiometric Ni-Cr-Mo alloysArticle