Optical constants and thickness determination of thin films using envelope method and inverse synthesis method: A comparative study

Jena, S.Tokas, R. B.Thakur, S.Sahoo, N. K.2014-03-282014-03-282013AIP Conference Proceedings, 2013. Vol. 1512 (1): pp. 632-633http://hdl.handle.net/123456789/89973703 bytestext/htmlenoptical constantsthin filmenvelope methodinverse synthesisOptical constants and thickness determination of thin films using envelope method and inverse synthesis method: A comparative studyArticle