Yadav, P. S.Kashyap, Y. S.Roy, T.Sarkar, P. S.Sinha, A.2010-02-172010-02-172007http://hdl.handle.net/123456789/18574672 bytestext/htmlenphase-contrast imaginghard X-rayssynchrotron sourcerefractive indexsignal-to-noise ratioedge enhancementQuantitative studies of pyrocarbon-coated materials using synchrotron radiationArticle