Comprehensive study on the origin of orthorhombic phase stabilization in Gd-doped HfO2 and DFT calculations

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dc.contributor.authorBanerjee, D.
dc.contributor.authorDey, C. C.
dc.contributor.authorRavi Kumar
dc.contributor.authorModak, B.
dc.contributor.authorHazra, S.
dc.contributor.authorDatta, S.
dc.contributor.authorGhosh, B.
dc.date.accessioned2023-12-19T09:58:30Z
dc.date.available2023-12-19T09:58:30Z
dc.date.issued2023
dc.description.divisionA&MPD;ChD;RPhD;BDASen
dc.format.extent5026 bytes
dc.format.mimetypetext/html
dc.identifier.sourcePhysical Chemistry Chemical Physics, 2023. Vol. 25: pp. 21479-21491en
dc.identifier.urihttp://hdl.handle.net/123456789/26284
dc.language.isoenen
dc.subjectComprehensive studyen
dc.subjectorthorhombic phase stabilizationen
dc.subjectGd-doped HfO2 and DFT calculationsen
dc.subjectultra-thin filmsen
dc.subjectField emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) measurementsen
dc.titleComprehensive study on the origin of orthorhombic phase stabilization in Gd-doped HfO2 and DFT calculationsen
dc.typeArticleen

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