Optical multilayer post growth instabilities: Analyses of Gd2O3/SiO2 system in combination with scanning probe force spectroscopy

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dc.contributor.authorSahoo, N. K.
dc.contributor.authorThakur, S.
dc.contributor.authorSenthilkumar, M.
dc.date.accessioned2018-08-24T06:15:56Z
dc.date.available2018-08-24T06:15:56Z
dc.date.issued2005
dc.description.divisionSpect. Div.en
dc.format.extent4642 bytes
dc.format.mimetypetext/html
dc.identifier.sourceApplied Surface Science, 2005. Vol. 252: pp. 1520-1537en
dc.identifier.urihttp://hdl.handle.net/123456789/16770
dc.language.isoenen
dc.subjectDeep UV optical coatingsen
dc.subjectMultilayer instabilityen
dc.subjectForce–distance spectroscopyen
dc.subjectSpectrophotometryen
dc.titleOptical multilayer post growth instabilities: Analyses of Gd2O3/SiO2 system in combination with scanning probe force spectroscopyen
dc.typeArticleen

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