A study of microstructural and optical properties of nanocrystalline ceria thin films prepared by pulsed laser deposition

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Date

2011

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Abstract

Description

Keywords

X-ray diffraction, Thin films, Cerium oxide, Pulsed laser deposition, Ellipsometry

Source

Thin Solid Films, 2011. Vol. 519 (8): pp. 2520-2526

URI

http://hdl.handle.net/123456789/5129

Collections

2011