Non-destructive elemental depth profiling of Ni/Ti multilayers by GIXRF technique

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dc.contributor.authorBiswas, A.
dc.contributor.authorAbharana, N.
dc.contributor.authorJha, S. N.
dc.contributor.authorBhattacharyya, D.
dc.date.accessioned2021-12-13T07:33:29Z
dc.date.available2021-12-13T07:33:29Z
dc.date.issued2021
dc.description.divisionA&MPDen
dc.format.extent4624 bytes
dc.format.mimetypetext/html
dc.identifier.sourceApplied Surface Science, 2021. Vol. 542: Article no. 148733en
dc.identifier.urihttp://hdl.handle.net/123456789/23688
dc.language.isoenen
dc.subjectGIXRFen
dc.subjectGIXRRen
dc.subjectDepth profilingen
dc.subjectNi/Ti multilayeren
dc.subjectElement specific diffusionen
dc.titleNon-destructive elemental depth profiling of Ni/Ti multilayers by GIXRF techniqueen
dc.typeArticleen

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