Ex-situ characterization of synchrotron radiation induced carbon contamination on LiF window

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dc.contributor.authorYadav, P. K.
dc.contributor.authorModi, M. H.
dc.contributor.authorSwami, M. K.
dc.contributor.authorSingh, P. J.
dc.date.accessioned2017-03-15T08:16:51Z
dc.date.available2017-03-15T08:16:51Z
dc.date.issued2016
dc.description.divisionA&MPDen
dc.format.extent4756 bytes
dc.format.mimetypetext/html
dc.identifier.sourceJournal of Electron Spectroscopy and Related Phenomena, 2016. Vol. 211: pp. 64-69en
dc.identifier.urihttp://hdl.handle.net/123456789/14207
dc.language.isoenen
dc.subjectGraphiteen
dc.subjectRaman spectroscopyen
dc.subjectSynchrotron radiationen
dc.subjectXPSen
dc.subjectXRDen
dc.titleEx-situ characterization of synchrotron radiation induced carbon contamination on LiF windowen
dc.typeArticleen

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