Dispersion of Resonant Raman Peaks of co and Oh in SnO2, Mo1− xFexO2 Thin Films and SiO2 Bulk Glass
dc.contributor.author | Raja Sekhar, B. N. | |
dc.contributor.author | Choudhary, R. J. | |
dc.contributor.author | Phase, D. M. | |
dc.contributor.author | Shailendra Kumar | |
dc.date.accessioned | 2010-03-08T09:30:50Z | |
dc.date.available | 2010-03-08T09:30:50Z | |
dc.date.issued | 2008 | |
dc.format.extent | 4132 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.uri | http://hdl.handle.net/123456789/2034 | |
dc.language.iso | en | en |
dc.subject | Resonance Raman peaks | en |
dc.subject | CO and OH stretching modes | en |
dc.subject | photoluminescence spectrum | en |
dc.subject | SnO2 thin films | en |
dc.title | Dispersion of Resonant Raman Peaks of co and Oh in SnO2, Mo1− xFexO2 Thin Films and SiO2 Bulk Glass | en |
dc.type | Article | en |