Band mapping of CeAg2Ge2 using angle-resolved photoemission spectroscopy

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dc.contributor.authorBanik, S.
dc.contributor.authorChakrabarti, A.
dc.contributor.authorDeb, S. K.
dc.contributor.authorJha, S. N.
dc.contributor.authorRao, S. V. N. B.
dc.contributor.authorJoshi, D. A.
dc.contributor.authorThamizhavel, A.
dc.contributor.authorDhar, S. K.
dc.date.accessioned2011-05-24T09:48:33Z
dc.date.available2011-05-24T09:48:33Z
dc.date.issued2010
dc.format.extent4320 bytes
dc.format.mimetypetext/html
dc.identifier.sourceSolid State Communications, 2010. Vol. 150 (39-40): pp. 1936-1939en
dc.identifier.urihttp://hdl.handle.net/123456789/4719
dc.language.isoenen
dc.subjectMetallic single crystalen
dc.subjectSelf-flux methoden
dc.subjectAngle resolved photoemission and band structure calculationen
dc.titleBand mapping of CeAg2Ge2 using angle-resolved photoemission spectroscopyen
dc.typeArticleen

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