Phase modulated spectroscopic ellipsometry of dielectric multilayer beam combiner

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dc.contributor.authorBhattacharyya, D.
dc.contributor.authorSahoo, N. K.
dc.contributor.authorThakur, S.
dc.contributor.authorDas, N. C.
dc.date.accessioned2019-05-20T05:34:52Z
dc.date.available2019-05-20T05:34:52Z
dc.date.issued2002
dc.description.divisionSpect. Div.en
dc.format.extent4176 bytes
dc.format.mimetypetext/html
dc.identifier.sourceThin Solid Films, 2002. Vol. 416: pp. 97-105en
dc.identifier.urihttp://hdl.handle.net/123456789/18416
dc.language.isoenen
dc.subjectSpectroscopic ellipsometryen
dc.subjectDielectricen
dc.subjectBeamen
dc.titlePhase modulated spectroscopic ellipsometry of dielectric multilayer beam combineren
dc.typeArticleen

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