Tuning the properties of tin oxide thin films for device fabrications

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dc.contributor.authorSudha, A.
dc.contributor.authorSharma, S. L.
dc.contributor.authorGupta, A. N.
dc.contributor.authorSharma, S. D.
dc.date.accessioned2018-06-08T08:28:20Z
dc.date.available2018-06-08T08:28:20Z
dc.date.issued2017
dc.description.divisionRP&ADen
dc.format.extent4299 bytes
dc.format.mimetypetext/html
dc.identifier.sourceEuropean Physical Journal-B, 2017. Vol. 90 (11): pp. 1-6: Article no. 219en
dc.identifier.urihttp://hdl.handle.net/123456789/16347
dc.language.isoenen
dc.subjecttin oxide thin filmsen
dc.subjectdevice fabricationsen
dc.subjectthermal evaporationen
dc.subjectX-ray di raction studyen
dc.subjectgamma sensors and dosimetersen
dc.titleTuning the properties of tin oxide thin films for device fabricationsen
dc.typeArticleen

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