Impact of flow rate on sensitivity of semiconductor type thoron monitor

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dc.contributor.authorSumesh, C. G.
dc.contributor.authorVinod Kumar, A.
dc.contributor.authorTripathi, R. M.
dc.contributor.authorNair, R. N.
dc.contributor.authorPuranik, V. D.
dc.date.accessioned2014-06-02T10:06:14Z
dc.date.available2014-06-02T10:06:14Z
dc.date.issued2013
dc.description.divisionEADen
dc.format.extent4163 bytes
dc.format.mimetypetext/html
dc.identifier.sourceRadiation Measurements, 2013. Vol. 59: pp. 241-244en
dc.identifier.urihttp://hdl.handle.net/123456789/9475
dc.language.isoenen
dc.subjectCorrection factoren
dc.subjectRAD7en
dc.subjectShort half lifeen
dc.subjectRadon interferenceen
dc.subjectDouble filter assemblyen
dc.titleImpact of flow rate on sensitivity of semiconductor type thoron monitoren
dc.typeArticleen

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