CW laser damage study in Ag/TiO2 bilayer thin films: Role of interfacially diffused plasmonic silver nanoparticles

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dc.contributor.authorHaque, S. M.
dc.contributor.authorDe, R.
dc.contributor.authorPrathap, C.
dc.contributor.authorMishra, S.
dc.contributor.authorRao, K. D.
dc.date.accessioned2022-08-02T11:05:03Z
dc.date.available2022-08-02T11:05:03Z
dc.date.issued2021
dc.description.divisionA&MPD-V;BARCen
dc.format.extent4927 bytes
dc.format.mimetypetext/html
dc.identifier.sourceOptical Materials, 2021. Vol. 117: Article no. 111135en
dc.identifier.urihttp://hdl.handle.net/123456789/24892
dc.language.isoenen
dc.subjectAg–TiO2 thin filmen
dc.subjectElectron beam evaporationen
dc.subjectLocalized surface plasmon resonanceen
dc.subjectSpectroscopic ellipsometryen
dc.subjectContinuous wave laseren
dc.subjectLaser damageen
dc.titleCW laser damage study in Ag/TiO2 bilayer thin films: Role of interfacially diffused plasmonic silver nanoparticlesen
dc.typeArticleen

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