Partial density of 3d electrons in CrSi probed by resonant photoemission
dc.contributor.author | Banik, S. | |
dc.contributor.author | Tripathi, S. | |
dc.contributor.author | Jha, S. N. | |
dc.date.accessioned | 2022-07-20T09:34:37Z | |
dc.date.available | 2022-07-20T09:34:37Z | |
dc.date.issued | 2020 | |
dc.description.division | A&MPD | en |
dc.format.extent | 4441 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.source | AIP Conference Proceedings, 2020. Vol. 2265: Article no. 30366 | en |
dc.identifier.uri | http://hdl.handle.net/123456789/24830 | |
dc.language.iso | en | en |
dc.subject | Partial density | en |
dc.subject | 3d electrons | en |
dc.subject | resonant photoemission | en |
dc.subject | Resonant photoemission | en |
dc.title | Partial density of 3d electrons in CrSi probed by resonant photoemission | en |
dc.type | Article | en |