High pressure X-ray diffraction study of CdAl2Se4 and Raman study of AAl2Se4 (A = Hg, Zn) and CdAl2X4 (X = Se, S)

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dc.contributor.authorMeenakshi, S.
dc.contributor.authorVijayakumar, V.
dc.contributor.authorGodwal, B. K.
dc.contributor.authorEifler, A.
dc.contributor.authorOrgzall. I.
dc.contributor.authorTkachev, S.
dc.contributor.authorHochheimer, H. D.
dc.date.accessioned2007-09-20T08:47:55Z
dc.date.available2007-09-20T08:47:55Z
dc.date.issued2006
dc.format.extent4495 bytes
dc.format.mimetypetext/html
dc.identifier.urihttp://hdl.handle.net/123456789/650
dc.language.isoenen
dc.subjectHigh pressureen
dc.subjectX-ray diffractionen
dc.subjectCdAl2Se4en
dc.subjectRaman studiesen
dc.subjectHgAl2Se4en
dc.subjectZnAl2Se4en
dc.titleHigh pressure X-ray diffraction study of CdAl2Se4 and Raman study of AAl2Se4 (A = Hg, Zn) and CdAl2X4 (X = Se, S)en
dc.typeArticleen

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