Surface viscoelasticity studies of Gd2O3, SiO2 optical thin films and multilayers using force modulation and force-distance scanning probe microscopy

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dc.contributor.authorSahoo, N. K.
dc.contributor.authorThakur, S.
dc.contributor.authorSenthilkumar, M.
dc.contributor.authorDas, N. C.
dc.date.accessioned2021-08-06T09:56:22Z
dc.date.available2021-08-06T09:56:22Z
dc.date.issued2003
dc.description.divisionSpect. Div.en
dc.format.extent4533 bytes
dc.format.mimetypetext/html
dc.identifier.sourceApplied Surface Science, 2003. Vol. 206: pp. 271-293en
dc.identifier.urihttp://hdl.handle.net/123456789/23231
dc.language.isoenen
dc.subjectSurface viscoelasticityen
dc.subjectForce modulationen
dc.subjectForce±distance scanning probe microscopyen
dc.titleSurface viscoelasticity studies of Gd2O3, SiO2 optical thin films and multilayers using force modulation and force-distance scanning probe microscopyen
dc.typeArticleen

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