Hafnium oxide thin films studied by time differential perturbed angular correlations

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dc.contributor.authorDey, C. C.
dc.contributor.authorDey, S.
dc.contributor.authorBedi, S. C.
dc.contributor.authorDas, S. K.
dc.contributor.authorLorenz, M.
dc.contributor.authorGrundmann, M.
dc.contributor.authorVogt, J.
dc.contributor.authorButz, T.
dc.date.accessioned2012-01-06T06:44:22Z
dc.date.available2012-01-06T06:44:22Z
dc.date.issued2011
dc.format.extent4143 bytes
dc.format.mimetypetext/html
dc.identifier.sourceJournal of Applied Physics, 2011. Vol. 109 (11): pp. 113918.1-113918.6en
dc.identifier.urihttp://hdl.handle.net/123456789/5584
dc.language.isoenen
dc.subjectHafnium oxide thin films studyen
dc.subjecttime differential perturbed angular correlationsen
dc.subjectnuclear quadrupole interactionen
dc.subjectx-ray diffractionen
dc.titleHafnium oxide thin films studied by time differential perturbed angular correlationsen
dc.typeArticleen

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