Determination of band alignment in liquid exfoliated few-layer WSe2/SiO2 interface

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dc.contributor.authorRahul
dc.contributor.authorArora, S. K.
dc.contributor.authorJha, S. N.
dc.contributor.authorYogesh Kumar
dc.date.accessioned2022-12-09T06:54:41Z
dc.date.available2022-12-09T06:54:41Z
dc.date.issued2022
dc.description.divisionBDASen
dc.format.extent4141 bytes
dc.format.mimetypetext/html
dc.identifier.sourceMaterials Letters, 2022. Vol. 311: pp. 1-4: Article no. 131600en
dc.identifier.urihttp://hdl.handle.net/123456789/25370
dc.language.isoenen
dc.subjectSemiconductorsen
dc.subjectInterfacesen
dc.subjectXPSen
dc.titleDetermination of band alignment in liquid exfoliated few-layer WSe2/SiO2 interfaceen
dc.typeArticleen

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