Surface and electrical-transport studies of Ag/Al bilayer-structures grown by molecular beam epitaxy

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dc.contributor.authorDebnath, A. K.
dc.contributor.authorJoshi, N.
dc.contributor.authorMuthe, K. P.
dc.contributor.authorVyas, J. C.
dc.contributor.authorAswal, D. K.
dc.contributor.authorGupta, S. K.
dc.contributor.authorYakhmi, J. V.
dc.date.accessioned2018-08-23T10:17:31Z
dc.date.available2018-08-23T10:17:31Z
dc.date.issued2005
dc.description.divisionTPPEDen
dc.format.extent4453 bytes
dc.format.mimetypetext/html
dc.identifier.sourceApplied Surface Science, 2005. Vol. 243: pp. 220-227en
dc.identifier.urihttp://hdl.handle.net/123456789/16766
dc.language.isoenen
dc.subjectAg/Al bilayer-structuresen
dc.subjectMolecular beam epitaxyen
dc.subjectXPSen
dc.subjectAFMen
dc.subjectMetal-to-insulator transitionen
dc.titleSurface and electrical-transport studies of Ag/Al bilayer-structures grown by molecular beam epitaxyen
dc.typeArticleen

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