Diagnostics of microwave ECR generated plasma: Effect of contaminated reference electrode

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dc.contributor.authorKar, R.
dc.contributor.authorBarve, S. A.
dc.contributor.authorSingh, S. B.
dc.contributor.authorBarve, D. N.
dc.contributor.authorChand, N.
dc.contributor.authorPatil, D. S.
dc.date.accessioned2011-05-25T10:09:19Z
dc.date.available2011-05-25T10:09:19Z
dc.date.issued2010
dc.format.extent3896 bytes
dc.format.mimetypetext/html
dc.identifier.sourceVacuum, 2010. Vol. 85 (2): pp. 151-155en
dc.identifier.urihttp://hdl.handle.net/123456789/4740
dc.language.isoenen
dc.subjectMicrowave ECR plasmaen
dc.subjectPlasma diagnosticsen
dc.subjectLangmuir probesen
dc.subjectPlasma parametersen
dc.titleDiagnostics of microwave ECR generated plasma: Effect of contaminated reference electrodeen
dc.typeArticleen

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