Effect of annealing on microstructural and optoelectronic properties of nanocrystalline TiO2 thin films

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dc.contributor.authorPawar, S. G.
dc.contributor.authorChougule, M. A.
dc.contributor.authorDalavi, D. S.
dc.contributor.authorPatil, P. S.
dc.contributor.authorMoholkar, A. V.
dc.contributor.authorSen, S.
dc.contributor.authorKim, J. H.
dc.contributor.authorPatil, V. B.
dc.date.accessioned2014-03-05T08:55:40Z
dc.date.available2014-03-05T08:55:40Z
dc.date.issued2013
dc.description.divisionTPDen
dc.format.extent5194 bytes
dc.format.mimetypetext/html
dc.identifier.sourceJournal of Experimental Nanoscience, 2013. Vol. 8 (4): pp. 500-508en
dc.identifier.urihttp://hdl.handle.net/123456789/8753
dc.language.isoenen
dc.subjectsol–gel methoden
dc.subjectstructural propertiesen
dc.subjectoptical propertiesen
dc.subjectelectrical conductivityen
dc.titleEffect of annealing on microstructural and optoelectronic properties of nanocrystalline TiO2 thin filmsen
dc.typeArticleen

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