Plasma characterization in CW and pulsed mode and its effect on beam current in 2.45 GHz ECR Ion source

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dc.contributor.authorKewlani, H. M.
dc.contributor.authorGharat, S. H.
dc.contributor.authorRoychowdhury, P.
dc.contributor.authorDikshit, B.
dc.date.accessioned2024-07-19T05:04:45Z
dc.date.available2024-07-19T05:04:45Z
dc.date.issued2022
dc.description.divisionIADD;A&PPD;L&PTDen
dc.format.extent4260 bytes
dc.format.mimetypetext/html
dc.identifier.sourceJournal of Instrumentation (JINST), 2022. Vol. 17: Article no. P09016en
dc.identifier.urihttp://hdl.handle.net/123456789/26989
dc.language.isoenen
dc.subjectData acquisition conceptsen
dc.subjectIon sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS))en
dc.subjectPlasma diagnostics - probesen
dc.subjectPlasma generation (laserproduced, RF, x ray-produced)en
dc.titlePlasma characterization in CW and pulsed mode and its effect on beam current in 2.45 GHz ECR Ion sourceen
dc.typeArticleen

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