Synchrotron based XRD study on nano crystalline SnO2 under pressure

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dc.contributor.authorGarg, A. B.
dc.contributor.authorThangadurai, P.
dc.contributor.authorMeenakshi, S.
dc.contributor.authorRamasamy, S.
dc.date.accessioned2013-04-03T05:51:28Z
dc.date.available2013-04-03T05:51:28Z
dc.date.issued2012
dc.description.divisionHP&SRPDen
dc.format.extent3765 bytes
dc.format.mimetypetext/html
dc.identifier.sourceJournal of Physics-Conference Series, 2012. Vol. 377 (1): pp. 012022en
dc.identifier.urihttp://hdl.handle.net/123456789/7154
dc.language.isoenen
dc.subjectSynchrotron based XRD studyen
dc.subjectnano crystalline SnO2 under pressureen
dc.subjecthigh pressure x ray diffraction measurementsen
dc.subjectstructural phase transitionen
dc.titleSynchrotron based XRD study on nano crystalline SnO2 under pressureen
dc.typeArticleen

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