Quantification of 1.75 MeV Xe5+ induced defects in zirconia doped ceria (Ce0.8Zr0.2O2)

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dc.contributor.authorVivek Kumar
dc.contributor.authorSharma, S. K.
dc.contributor.authorSingh, Y.
dc.contributor.authorGrover, V.
dc.date.accessioned2024-02-28T10:50:35Z
dc.date.available2024-02-28T10:50:35Z
dc.date.issued2023
dc.description.divisionChDen
dc.format.extent4999 bytes
dc.format.mimetypetext/html
dc.identifier.sourceJournal of Applied Physics, 2023. Vol. 134: Article no. 65902en
dc.identifier.urihttp://hdl.handle.net/123456789/26523
dc.language.isoenen
dc.subjectQuantification of 1.75 MeV Xe5+ induced defectsen
dc.subjectzirconia doped ceria (Ce0.8Zr0.2O2)en
dc.subjectstructural stabilityen
dc.subjectamorphization and grain fragmentatioen
dc.titleQuantification of 1.75 MeV Xe5+ induced defects in zirconia doped ceria (Ce0.8Zr0.2O2)en
dc.typeArticleen

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