High-resolution study of x-rays emitted from highly charged S ions using a bent-crystal spectrometer

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dc.contributor.authorKasthurirangan, S.
dc.contributor.authorBanerjee, A.
dc.contributor.authorA. Kumar
dc.contributor.authorAgnihotri, A. N.
dc.contributor.authorMisra, D.
dc.contributor.authorTribedi, L. C.
dc.date.accessioned2014-05-26T09:53:09Z
dc.date.available2014-05-26T09:53:09Z
dc.date.issued2013
dc.description.divisionNPDen
dc.format.extent3773 bytes
dc.format.mimetypetext/html
dc.identifier.sourcePhysica Scripta, 2013. Vol. T156: Article no. 014009en
dc.identifier.urihttp://hdl.handle.net/123456789/9388
dc.language.isoenen
dc.subjectHigh-resolution studyen
dc.subjectX-ray spectroscopyen
dc.subjectS ionsen
dc.subjectbent-crystal spectrometeren
dc.titleHigh-resolution study of x-rays emitted from highly charged S ions using a bent-crystal spectrometeren
dc.typeArticleen

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