Plane strain compression testing of Sanicro 28 by channel-die compression test: A direct microstructural observation
dc.contributor.author | Srinivasan, N. | |
dc.contributor.author | Kain, V. | |
dc.contributor.author | Samajdar, I. | |
dc.contributor.author | Mani Krishna, K. V. | |
dc.contributor.author | Sivaprasad, P. V. | |
dc.date.accessioned | 2018-05-18T09:50:27Z | |
dc.date.available | 2018-05-18T09:50:27Z | |
dc.date.issued | 2017 | |
dc.description.division | MSD | en |
dc.format.extent | 4180 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.source | Materials Today-Proceedings, 2017. Vol. 4 (9): pp. 09888-09892 | en |
dc.identifier.uri | http://hdl.handle.net/123456789/16205 | |
dc.language.iso | en | en |
dc.subject | Plastic deformation | en |
dc.subject | Sanicro 28 | en |
dc.subject | Electron Backscattered Diffraction | en |
dc.subject | Misorientation | en |
dc.title | Plane strain compression testing of Sanicro 28 by channel-die compression test: A direct microstructural observation | en |
dc.type | Article | en |