X-ray diffraction line profile analysis for defect study in Cu-1 wt.% Cr-0.1 wt.% Zr alloy

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Date

2005

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Abstract

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Keywords

Stacking fault probability, Stacking fault energy, X-ray line profile analysis, Cu-Cr-Zr alloy

Source

Materials Characterization, 2005. Vol. 54: pp. 131-140

URI

http://hdl.handle.net/123456789/17525

Collections

2005