Correlation of atomic force–distance microscopy and spectrosphotometric techniques in the analysis of optical multilayer spectral aging process

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dc.contributor.authorSahoo, Naba K.
dc.contributor.authorThakur, Sudhakar
dc.contributor.authorTokas, Raj B.
dc.contributor.authorSenthilKumar, M.
dc.date.accessioned2007-09-18T10:53:20Z
dc.date.available2007-09-18T10:53:20Z
dc.date.issued2006
dc.format.extent4713 bytes
dc.format.mimetypetext/html
dc.identifier.urihttp://hdl.handle.net/123456789/607
dc.language.isoenen
dc.subjectForce– distance microscopyen
dc.subjectOptical multilayeren
dc.subjectPost-growth aging processen
dc.subjectOptical coatingen
dc.subjectMultilayer morphologyen
dc.subjectScanning probe microscopyen
dc.titleCorrelation of atomic force–distance microscopy and spectrosphotometric techniques in the analysis of optical multilayer spectral aging processen
dc.typeArticleen

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