Bond length variation in Zn substituted NiO studied from extended X-ray absorption fine structure

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dc.contributor.authorSingh, S. D.
dc.contributor.authorPoswal, A. K.
dc.contributor.authorKamal, C.
dc.contributor.authorRajput, P.
dc.contributor.authorChakrabarti, A.
dc.contributor.authorJha, S. N.
dc.contributor.authorGanguli, T.
dc.date.accessioned2017-11-06T05:54:30Z
dc.date.available2017-11-06T05:54:30Z
dc.date.issued2017
dc.description.divisionA&MPDen
dc.format.extent4648 bytes
dc.format.mimetypetext/html
dc.identifier.sourceSolid State Communications, 2017. Vol. 259: pp. 40-44en
dc.identifier.urihttp://hdl.handle.net/123456789/15230
dc.language.isoenen
dc.subjectOxide semiconductorsen
dc.subjectLocal structureen
dc.subjectEXAFSen
dc.titleBond length variation in Zn substituted NiO studied from extended X-ray absorption fine structureen
dc.typeArticleen

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