The Bonding Configuration in a Partially Relaxed Pseudomorphic Epilayer of SiGe: Evidence of the BC-8 Phase of Silicon
dc.contributor.author | Pandey, M. | |
dc.contributor.author | Ray, S. K. | |
dc.contributor.author | Selvam, P. | |
dc.date.accessioned | 2010-06-11T05:46:06Z | |
dc.date.available | 2010-06-11T05:46:06Z | |
dc.date.issued | 2008 | |
dc.format.extent | 4164 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.uri | http://hdl.handle.net/123456789/2557 | |
dc.language.iso | en | en |
dc.subject | bonding configuration | en |
dc.subject | pseudomorphic epilayer | en |
dc.subject | BC-8 phase | en |
dc.subject | Raman spectroscopic techniques | en |
dc.subject | x-ray diffraction | en |
dc.title | The Bonding Configuration in a Partially Relaxed Pseudomorphic Epilayer of SiGe: Evidence of the BC-8 Phase of Silicon | en |
dc.type | Article | en |