Emergent Interfacial Ferromagnetism and Exchange Bias Effect in Paramagnetic/Ferromagnetic Oxide Heterostructures
dc.contributor.author | Bhatt, H. | |
dc.contributor.author | Yogesh Kumar | |
dc.contributor.author | Prajapat, C. L. | |
dc.contributor.author | Basu, Saibal | |
dc.contributor.author | Singh, S. | |
dc.date.accessioned | 2022-07-15T10:38:01Z | |
dc.date.available | 2022-07-15T10:38:01Z | |
dc.date.issued | 2020 | |
dc.description.division | TPD;SSPD | en |
dc.format.extent | 4609 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.source | Advanced Materials Interfaces, 2020. Vol. 7: Article no. 2001172 | en |
dc.identifier.uri | http://hdl.handle.net/123456789/24810 | |
dc.language.iso | en | en |
dc.subject | emergent interfacial ferromagnetism | en |
dc.subject | exchange bias | en |
dc.subject | interfacial exchange coupling | en |
dc.subject | polarized neutron reflectometry | en |
dc.title | Emergent Interfacial Ferromagnetism and Exchange Bias Effect in Paramagnetic/Ferromagnetic Oxide Heterostructures | en |
dc.type | Article | en |