Determination of impurities in graphite using synchrotron radiation based X-ray fluorescence spectrometry
dc.contributor.author | Ghosh, M. | |
dc.contributor.author | Swain, K. K. | |
dc.contributor.author | Devi, P. S. R. | |
dc.contributor.author | Chavan, T. A. | |
dc.contributor.author | Singh, A. K. | |
dc.contributor.author | Tiwari, M. K. | |
dc.contributor.author | Verma, R. | |
dc.date.accessioned | 2017-11-10T10:03:27Z | |
dc.date.available | 2017-11-10T10:03:27Z | |
dc.date.issued | 2017 | |
dc.description.division | ACD | en |
dc.format.extent | 3983 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.source | Applied Radiation and Isotopes, 2017. Vol. 128: pp. 210-215 | en |
dc.identifier.uri | http://hdl.handle.net/123456789/15272 | |
dc.language.iso | en | en |
dc.subject | Graphite | en |
dc.subject | Impurities | en |
dc.subject | Synchrotron radiation | en |
dc.subject | EDXRF | en |
dc.subject | Internal standard method | en |
dc.title | Determination of impurities in graphite using synchrotron radiation based X-ray fluorescence spectrometry | en |
dc.type | Article | en |