Valence bands offset between depleted semiconductors measured by photoelectron spectroscopy

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dc.contributor.authorShailendra Kumar
dc.contributor.authorJha, S. N.
dc.contributor.authorJagannath
dc.contributor.authorGanguli, T.
dc.contributor.authorBhaskara Rao, S. V. N.
dc.contributor.authorDas, N. C.
dc.date.accessioned2021-03-17T06:49:42Z
dc.date.available2021-03-17T06:49:42Z
dc.date.issued2004
dc.description.divisionSpect. Div.;TPPEDen
dc.format.extent4333 bytes
dc.format.mimetypetext/html
dc.identifier.sourceApplied Surface Science, 2004. Vol. 229 (42826): pp. 324-332en
dc.identifier.urihttp://hdl.handle.net/123456789/22550
dc.language.isoenen
dc.subjectPhotoemission spectroscopyen
dc.subjectDepleted semiconductor filmsen
dc.titleValence bands offset between depleted semiconductors measured by photoelectron spectroscopyen
dc.typeArticleen

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