Light emitting diodes reliability review

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dc.contributor.authorChang, M. H.
dc.contributor.authorDas, D.
dc.contributor.authorVarde, P. V.
dc.contributor.authorPecht, M.
dc.date.accessioned2012-12-13T06:29:31Z
dc.date.available2012-12-13T06:29:31Z
dc.date.issued2012
dc.description.divisionRRSDen
dc.format.extent4719 bytes
dc.format.mimetypetext/html
dc.identifier.sourceMicroelectronics Reliability, 2012. Vol. 52 (5): pp. 762-782en
dc.identifier.urihttp://hdl.handle.net/123456789/6888
dc.language.isoenen
dc.subjectLight emitting diodes reliability reviewen
dc.subjectmicroelectronicsen
dc.subjectLED developersen
dc.subjectend-product manufacturers focus resourcesen
dc.titleLight emitting diodes reliability reviewen
dc.typeArticleen

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