Greatly enhanced H2S sensitivity using defect-rich titanium oxide films

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dc.contributor.authorJagadale, T. C.
dc.contributor.authorPrasad, V.
dc.contributor.authorRamgir, N. S.
dc.contributor.authorPrajapat, C.
dc.contributor.authorPatil, U. V.
dc.contributor.authorDebnath, A.
dc.contributor.authorAswal, D. K.
dc.contributor.authorGupta, S. K.
dc.date.accessioned2016-05-04T08:06:22Z
dc.date.available2016-05-04T08:06:22Z
dc.date.issued2015
dc.description.divisionTPDen
dc.format.extent4259 bytes
dc.format.mimetypetext/html
dc.identifier.sourceRSC Advances, 2015. Vol. 5 (113): pp. 93081-93088en
dc.identifier.urihttp://hdl.handle.net/123456789/12961
dc.language.isoenen
dc.subjectenhanced H2S sensitivityen
dc.subjectdefect-rich titanium oxide filmsen
dc.subjectX-ray absorption spectroscopy measurementsen
dc.subjectlaser energyen
dc.titleGreatly enhanced H2S sensitivity using defect-rich titanium oxide filmsen
dc.typeArticleen

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