Characterization of planar flaws by an integrated approach using phased array and synthetic aperture focusing technique

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dc.contributor.authorNanekar, P.
dc.contributor.authorJothilakshmi, N.
dc.contributor.authorAnish Kumar
dc.date.accessioned2020-11-17T04:46:46Z
dc.date.available2020-11-17T04:46:46Z
dc.date.issued2019
dc.description.divisionQADen
dc.format.extent4274 bytes
dc.format.mimetypetext/html
dc.identifier.sourceMeasurement Science & Technology, 2019. Vol. 147: Article no. 106845en
dc.identifier.urihttp://hdl.handle.net/123456789/21379
dc.language.isoenen
dc.subjectPhased arrayen
dc.subjectSAFTen
dc.subjectFull matrix captureen
dc.subjectFlaw characterizationen
dc.subjectWeld defectsen
dc.titleCharacterization of planar flaws by an integrated approach using phased array and synthetic aperture focusing techniqueen
dc.typeArticleen

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