Force–Distance Spectroscopy Morphology Statistics Studies of Composite Zirconia-Silica Thin Films

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dc.contributor.authorSahoo, N. K.
dc.contributor.authorTokas, Raj B.
dc.contributor.authorThakur, Sudhakar
dc.contributor.authorKamble, N. M.
dc.date.accessioned2007-09-17T11:04:23Z
dc.date.available2007-09-17T11:04:23Z
dc.date.issued2006
dc.format.extent4248 bytes
dc.format.mimetypetext/html
dc.identifier.urihttp://hdl.handle.net/123456789/562
dc.language.isoenen
dc.subjectComposite optical thin-filmen
dc.subjectzirconia-silica compositeen
dc.subjectmicroscopyen
dc.subjectmorphological propertiesen
dc.subjectforce-distance microscopyen
dc.subjectco-deposition processen
dc.titleForce–Distance Spectroscopy Morphology Statistics Studies of Composite Zirconia-Silica Thin Filmsen
dc.typeArticleen

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