X-ray absorption spectroscopy of Mn doped ZnO thin films prepared by rf sputtering technique

dc.contributor.authorYadav, A. K.
dc.contributor.authorHaque, S. M.
dc.contributor.authorShukla, D.
dc.contributor.authorChoudhary, R. J.
dc.contributor.authorJha, S. N.
dc.contributor.authorBhattacharyya, D.
dc.date.accessioned2016-04-06T06:29:30Z
dc.date.available2016-04-06T06:29:30Z
dc.date.issued2015
dc.description.divisionA&MPDen
dc.format.extent3977 bytes
dc.format.mimetypetext/html
dc.identifier.sourceAIP Advances, 2015. Vol. 5 (11): pp. 117138.1-117138.17en
dc.identifier.urihttp://hdl.handle.net/123456789/12764
dc.language.isoenen
dc.subjectX-ray absorption spectroscopyen
dc.subjectMn doped ZnO thin filmsen
dc.subjectrf sputtering techniqueen
dc.subjectEXAFS and XANES measurementsen
dc.titleX-ray absorption spectroscopy of Mn doped ZnO thin films prepared by rf sputtering techniqueen
dc.typeArticleen

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