X-ray absorption spectroscopy of Mn doped ZnO thin films prepared by rf sputtering technique
dc.contributor.author | Yadav, A. K. | |
dc.contributor.author | Haque, S. M. | |
dc.contributor.author | Shukla, D. | |
dc.contributor.author | Choudhary, R. J. | |
dc.contributor.author | Jha, S. N. | |
dc.contributor.author | Bhattacharyya, D. | |
dc.date.accessioned | 2016-04-06T06:29:30Z | |
dc.date.available | 2016-04-06T06:29:30Z | |
dc.date.issued | 2015 | |
dc.description.division | A&MPD | en |
dc.format.extent | 3977 bytes | |
dc.format.mimetype | text/html | |
dc.identifier.source | AIP Advances, 2015. Vol. 5 (11): pp. 117138.1-117138.17 | en |
dc.identifier.uri | http://hdl.handle.net/123456789/12764 | |
dc.language.iso | en | en |
dc.subject | X-ray absorption spectroscopy | en |
dc.subject | Mn doped ZnO thin films | en |
dc.subject | rf sputtering technique | en |
dc.subject | EXAFS and XANES measurements | en |
dc.title | X-ray absorption spectroscopy of Mn doped ZnO thin films prepared by rf sputtering technique | en |
dc.type | Article | en |