An improved ion source for thermal ionization mass spectrometer

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dc.contributor.authorBasak, A.
dc.contributor.authorBhatia, R. K.
dc.contributor.authorYadav, V. K.
dc.contributor.authorRavisankar, E.
dc.contributor.authorSaha, T. K.
dc.contributor.authorNataraju, V.
dc.contributor.authorGadkari, S. C.
dc.date.accessioned2018-06-11T05:31:07Z
dc.date.available2018-06-11T05:31:07Z
dc.date.issued2017
dc.description.divisionTPDen
dc.format.extent3878 bytes
dc.format.mimetypetext/html
dc.identifier.sourceInternational Journal of Mass Spectrometry, 2017. Vol. 423: pp. 33-38en
dc.identifier.urihttp://hdl.handle.net/123456789/16361
dc.language.isoenen
dc.subjectSensitivityen
dc.subjectIon sourceen
dc.subjectIon opticsen
dc.subjectTIMSen
dc.subjectMagnetic sector analyzeren
dc.subjectIsotope ratioen
dc.titleAn improved ion source for thermal ionization mass spectrometeren
dc.typeArticleen

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