Post-irradiated microstructural characterisation of cold-worked SS316L by X-ray diffraction technique

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dc.contributor.authorMukherjee, P.
dc.contributor.authorSarkar, A.
dc.contributor.authorBhattacharya, M.
dc.contributor.authorGayathri, N.
dc.contributor.authorBarat, P.
dc.date.accessioned2010-08-27T03:28:53Z
dc.date.available2010-08-27T03:28:53Z
dc.date.issued2009
dc.format.extent3940 bytes
dc.format.mimetypetext/html
dc.identifier.urihttp://hdl.handle.net/123456789/3793
dc.language.isoenen
dc.subjectPost-irradiated microstructural characterisationen
dc.subjectcold-worked SS316Len
dc.subjectX-ray diffraction techniqueen
dc.subjectWilliamson–Hall Techniqueen
dc.subjectLine Profile Analysisen
dc.titlePost-irradiated microstructural characterisation of cold-worked SS316L by X-ray diffraction techniqueen
dc.typeArticleen

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