Synthesis and characterization of Cu2ZnSnS4 thin films by SILAR method

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dc.contributor.authorMali, S. S.
dc.contributor.authorShinde, P. S.
dc.contributor.authorBetty, C. A.
dc.contributor.authorBhosale, P. N.
dc.contributor.authorOh, Y. W.
dc.contributor.authorPatil, P. S.
dc.date.accessioned2012-08-27T10:24:09Z
dc.date.available2012-08-27T10:24:09Z
dc.date.issued2012
dc.description.divisionChDen
dc.format.extent4125 bytes
dc.format.mimetypetext/html
dc.identifier.sourceJournal of Physics & Chemistry of Solids, 2012. Vol. 73 (6): pp. 735-740en
dc.identifier.urihttp://hdl.handle.net/123456789/6580
dc.language.isoenen
dc.subjectSemiconductingen
dc.subjectChemical synthesisen
dc.subjectX-ray diffractionen
dc.subjectElectrochemical propertiesen
dc.titleSynthesis and characterization of Cu2ZnSnS4 thin films by SILAR methoden
dc.typeArticleen

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