Preparation and characterization of nanocrystalline tin oxide thin films deposited at room temperature

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dc.contributor.authorDeshpande, N. G.
dc.contributor.authorVyas, J. C.
dc.contributor.authorSharma, R.
dc.date.accessioned2010-04-16T04:47:05Z
dc.date.available2010-04-16T04:47:05Z
dc.date.issued2008
dc.format.extent4152 bytes
dc.format.mimetypetext/html
dc.identifier.urihttp://hdl.handle.net/123456789/2222
dc.language.isoenen
dc.subjectAtomic force microscopy (AFM)en
dc.subjectTin oxideen
dc.subjectX-ray diffractionen
dc.subjectM-SILARen
dc.subjectNanostructuresen
dc.subjectPhotoluminescenceen
dc.titlePreparation and characterization of nanocrystalline tin oxide thin films deposited at room temperatureen
dc.typeArticleen

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